This fascinating area is a minefield of conflicting commercial, IP & competition issues.
The dynamics of the relationship between standards and patents poses a gamut of challenges for patentees, licencees, standard setting organisations, innovators, commecial users and implementers.
Patents may value the unique but the technical standard has become the friend (or foe) that defines the uniform.
Featuring expert speakers from accross the Globe and a thought provoking agenda covering all the important topics, this is an event not to miss!
Find out more on the latest agenda for the Standards and Patents conference.
Keynote:
- Per Hellström, Head of Unit C-3: Antitrust, IT, Internet and Consumer Electronics, DG Competition, European Commission
Special Address:
- Donncadh Woods, Deputy Head of Unit (COMP-A-2 Antitrust and Mergers - Policy and Scrutiny), DG Competition, European Commission
A Judges Panel Featuring:
- Mr Justice Floyd, Judge, Patent Court, Royal Courts of Justice
- Edger F. Brinkman, Judge, Patent Court, The Netherlands
- Dr. Martin Ebner, Judge, Munich Regional Court, Germany
Chair Day 1:
- Nigel Stoate, Partner, Taylor Wessing LLP
Chair Day 2:
- James Marshall, Partner, Taylor Wessing LLP
Plus Industry Viewpoints from:
- Jonathan Sage, EU Technology Policy Lead, IBM Governmental Programmes, IBM
- Nicholas Schifano, Microsoft
- Alfred Chaouat, , Senior Vice President – Licensing, Technicolor, ; President, LES France
- Keith Maillinson, Wiseharbor
- Clemens Heusch, Nokia
- Mialeeka Williams, Legal Counsel, The Coca Cola Company
- Dave McAllister, Director, Open Source and Standards Core Services, Experience and Technology Organization, Adobe Systems Inc.
- David Muus, Legal Counsel, KPN
- Sarah Guichard, VP Patent Development & Standards Strategy, Research In Motion
- Urska Petrovcic, Research Fellow, European University Institute
- Harald Heiske, Head of Consultancy, Siemens AG
- Loreto Reguero, Intel
- Sabina Brufani,Business Development Director, Sisvel
- Robert Vidal, Partner, Taylor Wessing LLP
"Very thorough overview of the key issues"